Semiconductor Engineering

Using Deep Learning ADC For Defect Classification For Automatic Defect Inspection

In traditional semiconductor packaging, manual defect review after automated optical inspection (AOI) is an arduous task for operators and engineers, involving review of both good and bad die. It is ...
The Lancet

Detection of young-onset type 2 diabetes using deep learning across primary and secondary care: a nationwide, retrospective cohort study

This study highlights the potential for using deep learning methods on longitudinal health data from both primary and ...
European Medical Journal

Artificial Intelligence Enhances Brain Tumour Diagnosis From MRI

Deep learning improves brain tumour detection accuracy and reduces false positives in MRI, supporting faster and more ...
eWeek

Deep Learning vs Generative AI: Understanding the Key Differences

AI thrives on data but feeding it the right data is harder than it seems. As enterprises scale their AI initiatives, they face the challenge of managing diverse data pipelines, ensuring proximity to ...