Samsung Electronics Co. Ltd. has successfully completed its evaluation of KLA-Tencor Corp.'s 2350 ultraviolet (UV) high-resolution imaging wafer inspection tool for use in monitoring the production of ...
Advancements in structured illumination and computational imaging are revolutionizing semiconductor wafer inspection, ...
MUNICH, Germany — Negevtech Ltd., a wafer inspection company formed by former Orbot Instruments Ltd. executives, has started to record equipment sales for its Negevtech 302 wafer inspection machine, ...
November 24, 2013. Rudolph Technologies has announced that it has won orders for its AWX FSI unpatterned wafer inspection system at both a major Southeast Asia-based outsourced assembly and test (OSAT ...
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New Microtronic WaferWeight Precisely Monitors Semiconductor Wafer Mass During Macro Defect Inspection
Microtronic, maker of advanced macro defect inspection systems and software, has announced a convenient and highly precise way to monitor the weights of semiconductor wafers at the same time as ...
Unpatterned wafer inspection, which has flown well under the radar for most of the semiconductor industry, is becoming more critical amid the need to find defects earlier in the manufacturing process ...
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