A new wafer inspection platform combines AI analytics, sub-micron imaging, SWIR sensing, and precision metrology to help ...

Taiwan-based manufacturer of AI fabric inspection machines shows end-to-end fabric defect detection and data integration from inspection through spreading to cutting NEW TAIPEI CITY, April 30, 2026 ...

The Department of Science and Technology (DOST) has unveiled new equipment capable of analyzing materials and detecting ...

BMW researchers have demonstrated that camera-based inspection systems can catch manufacturing flaws in battery electrodes ...

The system, developed by Panevo, a Canadian clear technology and manufacturing analytics company, reportedly achieved approximately 97% detection reliability with minimal false positives of Muskoka’s ...

Researchers have tested eight stand-alone deep learning methods for PV cell fault detection and have found that their accuracy was as high as 73%. All methods were trained and tested on the ELPV ...

Detecting macro-defects early in the wafer processing flow is vital for yield and process improvement, and it is driving innovations in both inspection techniques and wafer test map analysis. At the ...

Modern advanced packaging processes and shrinking semiconductor device sizes mean that it is vital to consistently eliminate sub-20 nm defects and surface contaminants. To do this effectively, the ...

Bullen Ultrasonics Research and Early Innovation Manager Eric Norton to Speak at Ceramics Expo 2026 on Technology Transfer ...